International Journal of Electrical and Power Engineering

Year: 2011
Volume: 5
Issue: 1
Page No. 18 - 23

Comparison of Low Field Electron Transport in Zincblende and Wurtzite 6H-SiC Structures for High Gain Device Modeling

Authors : H. Arabshahi and F. Sarlak

Abstract: Temperature and doping dependencies of electron mobility in both wurtzite and zincblende 6H-SiC structures have been calculated using an Iteravive technique. The following scattering mechanisims, i.e., impurity, polar optical phonon, acoustic phonon, piezoelectric and electron plasmon are inculded in the calculation. Ionized imurity scattering has been treated beyound the born approximation using the phase-shift analysis. It is found that the electron mobility decreases monotonically as the temperature increases from 100-600 K. The low temperature value of electron mobilty increases significantly with increasing doping concentration. The iterative results are in fair agreement with other recent calculations obtained using the relaxation-time approximation and experimental methods.

How to cite this article:

H. Arabshahi and F. Sarlak, 2011. Comparison of Low Field Electron Transport in Zincblende and Wurtzite 6H-SiC Structures for High Gain Device Modeling. International Journal of Electrical and Power Engineering, 5: 18-23.

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