Asian Journal of Information Technology

Year: 2016
Volume: 15
Issue: 23
Page No. 4800 - 4805

Test Case Generation for Pairwise+Testing

Authors : V. Chandra Prakash and Kadiyala Priyanka

Abstract: Software system faults can be completely detected only through exhaustive testing. But, it cannot be performed on many of the real-life systems because it may be too expensive as it may consume an enormous amount of time. The t-way combinatorial testing enables testing to be performed at low cost and less time. The value of t starts from 2 and takes 3, 4, 5 and so on. As the value of t increases, the size of the test suite increases and thus it takes more time for testing the system. In pairwise testing (t = 2), every pair of parameter values in the input domain is covered by at least one test case. It is highly effective in detecting up to 70% of faults triggered by a system. In 3-way testing, every triple of parameter values in input domain is covered by at least one test case. It can detect up to 90% of faults triggered by a system but the size of test suite is relatively larger. Therefore, pairwise testing is widely used in industry. When a test suite is generated for pairwise testing, it may contain a lot of gaps. The gaps have to be filled with some arbitrary values in order to proceed for testing. In this paper, we present an approach called pairwise+ testing in which the gaps in the test suite are filled in such a way that many of the triples that are useful for a 3-way testing are accommodated in the test suite. Thus the test suite generated for pairwise testing is enriched to cover a part of 3-way testing. Depending on the amount of coverage, the percentage of failures triggered by pairwise+ testing can be estimated to be anywhere within the range of 70 and 90%.

How to cite this article:

V. Chandra Prakash and Kadiyala Priyanka, 2016. Test Case Generation for Pairwise+Testing. Asian Journal of Information Technology, 15: 4800-4805.

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