Journal of Engineering and Applied Sciences

Year: 2018
Volume: 13
Issue: 11
Page No. 4235 - 4244

Image Steganography Technique Based on Extracted Chains from the Secret Key

Authors : Mohammed Abbas Fadhil Al-Husainy and Diaa Mohammed Uliyan

Abstract: Image stegangoraphy is considered as an active research topic where secret information is embedded in digital images while preserving their visual quality. Recently, various image steganography techniques focused on payload capacity, robustness and imperceptibility. However, there is a state of art between of these three metrics and keeping a balance between them is still a challenge problem. In addition, some existing techniques failed to gain better security caused by direct embedding of secret data inside images without encryption or random placement consideration. This issue could make image styganalysis quite easy for an adversary. Therefore, in this study, Least Significant Bit (LSB) is used to replace the least significant bits of image pixels with the bits of secret data. We propose a secure image steganography method based on stego-key. Secret data is embedded randomly in LSB of the image pixels based on chain of secret keys. The common pipeline of our method starts by dividing the image into a group of two-dimensional blocks and uses a set of two-dimensional stego-key. Then, the secret data is hidden in the pixels of each image block, based on the extracted chains from the stego-key. The quantitative and qualitative experimental results show that, the proposed method can achieve a good balance between visual image quality and its security, providing a high capacity for hiding data with relatively less time complexity. A relatively large size stego-key is also employed in order to increase the level of security for the proposed method and makes it hard to detect by the brute force attacks.

How to cite this article:

Mohammed Abbas Fadhil Al-Husainy and Diaa Mohammed Uliyan, 2018. Image Steganography Technique Based on Extracted Chains from the Secret Key. Journal of Engineering and Applied Sciences, 13: 4235-4244.

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