Research Journal of Applied Sciences

Year: 2007
Volume: 2
Issue: 8
Page No. 859 - 864

Intelligent Instrumentation Approach to Semiconductor Temperature Measurement by Analogue Transmission Using a Z80 Microcomputer

Authors : A.A. Adegbemile

Abstract: A Z80 microcomputer based instrumentation which makes use of semiconductor transducer, analogue to digital converter and which samples temperatures at 1 min interval at a point where it may vary in the range of 0-100 C was examined. The 8 bit binary code output of the Analogue to Digital Converter (ADC) and the corresponding temperature values were obtained with an input voltage range of 0-8V increased at an interval of 0.5 V. The ADC total levels of 256 and the resolution of 31.25 mV were determined. A hierarchical decomposition diagram, a proper structural description and a pseudo-code description of the modules of the software routines at all levels were developed to store the 256 temperature values and compute the highest, lowest, average and the number of temperature which exceed 50 C.

How to cite this article:

A.A. Adegbemile , 2007. Intelligent Instrumentation Approach to Semiconductor Temperature Measurement by Analogue Transmission Using a Z80 Microcomputer. Research Journal of Applied Sciences, 2: 859-864.

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