Research Journal of Applied Sciences

Year: 2015
Volume: 10
Issue: 4
Page No. 173 - 175

Development of a Computer-Based Stand for Testing Algorithms of Electrical Impedance Tomography

Authors : Danil Shaykhutdinov, Nikolay Gorbatenko, Grayr Aleksanyan, Valeriy Grechikhin, Konstantin Shirokov, Viacheslav Dubrov and Mikhail Lankin

Abstract: The study describes the materials on the development and testing bench for the study of algorithms and methods of processing the results of measurements of the electrical parameters of the object for subsequent visualization of its internal structure. To implement the hardware configuration is chosen platform National Instruments PXI. The platform is equipped with an additional set of input-output modules to provide a controlled supply of AC signals to the object of measurement capabilities. Calculation of the resistance distribution of the internal structure and its visualization is performed using special software.

How to cite this article:

Danil Shaykhutdinov, Nikolay Gorbatenko, Grayr Aleksanyan, Valeriy Grechikhin, Konstantin Shirokov, Viacheslav Dubrov and Mikhail Lankin, 2015. Development of a Computer-Based Stand for Testing Algorithms of Electrical Impedance Tomography. Research Journal of Applied Sciences, 10: 173-175.

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