References

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Kuffel, J. and P. Kuffel, 2000. High Voltage Engineering Fundamentals. 2nd Edn., University of Manitoba, Winnipeg, Manitoba, Pages: 359.

Lloydand, K.J. and H.M. Schneider, 1982. Insulation for power frequency voltage transmission line reference book (345 kV and above). Electric Power Research Institute, Palo Alto, California.

Looms, T.J., 1988. Insulators for High Voltage. Peter Peregrinus Ltd, London, UK.,.

Mekhaldi, A., D. Namane, S. Bouazabia and A. Beroual, 1999. Flashover of discontinuous pollution layer on HV insulators. IEEE. Trans. Dielectr. Electr. Insul., 6: 900-906.
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Obenaus, F., 1960. Creepage distance of insulators with extraneous layers. Elektrizitatsirtschaft, 24: 878-882.

Pakpahan, P.M., 2006. Study on the electrical equivalent circuit models of polluted outdoor insulators. Proceedings of the 8th International Conference on Properties and Applications of Dielectric Materials, June 26-30, 2006, IEEE, Bandung, Indonesia, ISBN:1-4244-0189-5, pp: 546-549.

Patel, K. and B.R. Parekh, 2013. Prediction of flashover of silicone rubber insulator under different contaminated surface conditions. Proceedings of the IEEE 1st International Conference on Condition Assessment Techniques in Electrical Systems, December 6-8, 2013, IEEE, Ahmadabad, India, ISBN:978-1-4799-0083-1, pp: 358-361.

Ramirez, I., R. Hernandez and G. Montoya, 2012. Measurement of leakage current for monitoring the performance of outdoor insulators in polluted environments. IEEE. Electr. Insul. Mag., 28: 29-34.
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Siderakis, K., D. Agoris, P. Eleftheria and E. Thalassinakis, 2004. Investigation of leakage current on high voltage insulators-field measurements. WSEAS Trans. Circuits Syst., 5: 1188-1191.

Suwarno, S. and F. Pratomosiwi, 2009. Electrical equivalent circuit of ceramic insulators with RTV silicone rubber coating and computer simulation of leakage currents. WSEAS. Trans. Circuits Syst., 8: 360-369.
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Venkataraman, S. and R.S. Gorur, 2006. Prediction of flashover voltage of non-ceramic insulators under contaminated conditions. IEEE. Trans. Dielectr. Electr. Insul., 13: 862-869.
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