References

Banerjee, A.N. and K.K. Chattopadhyay, 2005. Recent developments in the emerging field of crystalline P-type transparent conducting oxide thin films. Prog. Crystal Growth Charact. Mater., 50: 52-105.
Direct Link  |  

Chan, D.S.H., J.R. Phillips and J.C.H. Phang, 1986. A comparative study of extraction methods for solar cell model parameters. Solid State Electron., 29: 329-337.
Direct Link  |  

Dijkkamp, D., T. Venkatesan, X.D. Wu, S.A. Shaheen and N. Jisrawi et al., 1987. Preparation of Y‐Ba‐Cu oxide superconductor thin films using pulsed laser evaporation from high TC bulk material. Appl. Phys. Lett., 51: 619-621.
Direct Link  |  

Gartner, M., C. Parlog and P. Osiceanu, 1993. Spectroellipsometric characterization of lanthanide-doped TiO₂ films obtained via the sol-gel technique. Thin Solid Films, 234: 561-565.
Direct Link  |  

Kozlowski, M.R., P.S. Tyler, W.H. Smyrl and R.T. Atanasoski, 1989. Anodic TiO₂ thin films photoelectrochemical, electrochemical and structural study of heat‐treated and modified films. J. Electrochem. Soc., 136: 442-450.
CrossRef  |  Direct Link  |  

Leprince-Wang, Y. and K. Yu-Zhang, 2001. Study of the growth morphology of TiO₂ thin films by AFM and TEM. Surf. Coat. Technol., 140: 155-160.
Direct Link  |  

Linsebigler, A.L., G. Lu and J.T. Yates Jr, 1995. Photocatalysis on TiO₂ surfaces: Principles, mechanisms and selected results. Chem. Rev., 95: 735-758.
CrossRef  |  Direct Link  |  

Lottiaux, M., C. Boulesteix, G. Nihoul, F. Varnier and F. Flory et al., 1989. Morphology and structure of TiO₂ thin layers vs thickness and substrate temperature. Thin Solid Films, 170: 107-126.
Direct Link  |  

Mazhir, S.N. and N.H. Harb, 2015. Influence of concentration on the structural, optical and electrical properties of TiO₂: CuO thin film fabricate by PLD. IOSR. J. Appl. Phys., 7: 14-21.
CrossRef  |  Direct Link  |  

Mazhir, S.N., 2018. Spectroscopic study of (TiO₂)_1-x(CuO)_x Plasma generated by Nd: YAG laser. ARPN. J. Eng. Appl. Sci., 13: 864-869.
Direct Link  |  

Mazhir, S.N., G.H. Mohamed, A.A. Abdullah and M.D. Radhi, 2015. UV photovoltaic detector based on Bi doped TiO₂ fabricated by pulse laser deposition. Int. J. Adv. Res., 3: 1060-1070.

Mechiakh, R. and R. Bensaha, 2006. Analysis of optical and structural properties of Sol-Gel TiO₂ thin films. Moroccan J. Condens. Matter, 7: 54-57.

Meng, L.J., M. Andritschky and D.M.P. Santos, 1993. The effect of substrate temperature on the properties of DC reactive magnetron sputtered titanium oxide films. Thin Solid Films, 223: 242-247.
Direct Link  |  

Messick, L., 1976. A GaAs/Si x O y N z MIS FET. J. Appl. Phys., 47: 5474-5475.
Direct Link  |  

Oehrlein, G.S., 1986. Oxidation temperature dependence of the dc electrical conduction characteristics and dielectric strength of thin Ta₂O₅ films on silicon. J. Appl. Phys., 59: 1587-1595.
Direct Link  |  

Oral, A.Y., E. Mensur, M.H. Aslan and E. Basaran, 2004. The preparation of copper (II) oxide thin films and the study of their microstructures and optical properties. Mater. Chem. Phys., 83: 140-144.
Direct Link  |  

Papadimitropoulos, G., N. Vourdas, V.E. Vamvakas and D. Davazoglou, 2006. Optical and structural properties of copper oxide thin films grown by oxidation of metal layers. Thin Solid Films, 515: 2428-2432.
Direct Link  |  

Patterson, A.L., 1939. The Scherrer formula for X-ray particle size determination. Phys. Rev., 56: 978-982.
CrossRef  |  Direct Link  |  

Ristov, M., G.J. Sinadinovski and I. Grozdanov, 1985. Chemical deposition of Cu₂O₂ thin films. Thin Solid Films, 123: 63-67.
Direct Link  |  

Smith, H.M. and A.F. Turner, 1965. Vacuum deposited thin films using a ruby laser. Appl. Opt., 4: 147-148.
Direct Link  |  

Suhail, M.H., G.M. Rao and S.D.C.J. Mohan, 1992. DC reactive magnetron sputtering of titanium‐structural and optical characterization of TiO₂ films. J. Appl. Phys., 71: 1421-1427.
Direct Link  |  

Williams, L.M. and D.W. Hess, 1983. Structural properties of titanium dioxide films deposited in an RF glow discharge. J. Vac. Sci. Technol. A Vac. Surf. Films, 1: 1810-1819.
Direct Link  |  

Wilmsen, C.N., 1985. Physics and Chemistry of Compound III-V Semiconductor Interfaces. Plenum Press, New York, USA., ISBN:9780306417696, Pages: 465.

Yaseen, H.M., B.G. Rasheed and S.N. Mazhir, 2016. Judd-ofelt analysis of spectroscopic properties of Er+3: TiO₂ prepared via sol-gel. IOSR. J. Res. Method Educ., 6: 30-33.

Yeung, K.S. and Y.W. Lam, 1983. A simple chemical vapour deposition method for depositing thin TiO₂ films. Thin Solid Films, 109: 169-178.
Direct Link  |  

Yoon, K.H., W.J. Choi and D.H. Kang, 2000. Photoelectrochemical properties of copper oxide thin films coated on an n-Si substrate. Thin Solid Films, 372: 250-256.
Direct Link  |