References

Adamou-Mitiche, A.B.H., L. Mitiche and H. Naimi, 2016. Three levels discrete wavelet transform elliptic estimation for ECG denoising. Proceedings of the 4th International Conference on Control Engineering and Information Technology (CEIT16), December 16-18, 2016, IEEE, Djelfa, Algeria, ISBN:978-1-5090-1056-1, pp: 1-5.

Akujuobi, C.M. and L. Hu, 2002. A novel parametric test method for communication systems mixed-signal circuits using discrete wavelet transform. Proceedings of the Conference on Communications, Internet and Information Technology, November 18, 2002, Allen Institute, St. Louis, Missouri, pp: 132-135.

Akujuobi, C.M. and L. Hu, 2003. Implementation of the Wavelet Transform-based Techniques for Static Testing of Mixed Signal Systems. In: Proceedings of the 2003 IASTED International Conference on Modelling and Simulation (MS’03), February 24-26, 2003, Springs, California, USA., pp: 56-59.

Akujuobi, C.M., E. Awada, M. Sadiku and W. Ali, 2007. Wavelet-based differential nonlinearity testing of mixed signal system ADCs. Proceedings of the 2007 IEEE Conference on SoutheastCon 2007, March 22-25, 2007, IEEE, Prairie View, Texas, ISBN:1-4244-1028-2, pp: 76-81.

Awada, E., C.M. Akujuobi and M.N.O. Sadiku, 2010. A reduced-code linearity test for DAC using wavelet analysis. Int. J. Eng. Res. Innovat., 2: 69-76.
Direct Link  |  

Awada, E.A., 2013. The application wavelet transform algorithm in testing ADC effective number of bits Intl. J. Comput. Sci. Inf. Technol., 5: 161-169.
CrossRef  |  Direct Link  |  

Bayram, D. and S. Seker, 2016. Redundancy based predictive fault detection on electric motors by stationary wavelet transform. IEEE. Trans. Ind. Appl., 53: 2997-3004.
CrossRef  |  Direct Link  |  

Burns, M., G.W. Roberts and F. Taenzler, 2001. An Introduction to Mixed-Signal IC Test and Measurement. Vol. 2001, Oxford University Press, New York, USA., ISBN:9780195140163, Pages: 677.

Cherubal, S. and A. Chatterjee, 2003. Optimal linearity testing of analog-to-digital converters using a linear model. IEEE. Trans. Circuits Syst. Fundam. Theory Appl., 50: 317-327.
CrossRef  |  Direct Link  |  

Gandelli, A. and E. Ragaini, 1996. ADC transfer function analysis by means of a mixed wavelet-Walsh transform. Proceedings of the 1996 IEEE Conference on Quality Measurements Indispensable Bridge between Theory and Reality Instrumentation and Measurement Technology (IMTC-96) Vol. 2, June 4-6, 1996, IEEE, Milan, Italy, ISBN:0-7803-3312-8, pp: 1314-1318.

Gomez-Pau, A., L. Balado and J. Figueras, 2015. Mixed-signal test band guarding using digitally coded indirect measurements. Proceedings of the 2015 International Conference on Synthesis Modeling Analysis and Simulation Methods and Applications to Circuit Design (SMACD), September 7-9, 2015, IEEE, Barcelona, Spain, ISBN:978-1-4673-9185-6, pp: 1-4.

Kollar, I. and J.J. Blair, 2005. Improved determination of the best fitting sine wave in ADC testing. IEEE. Trans. Instrum. Meas., 54: 1978-1983.
CrossRef  |  Direct Link  |  

Mallat, S., 1999. Wavelet Tour of Signal Processing. 2nd Edn., Academic Press, England, UK., ISBN-13:978-0-12-466606-1, Pages: 491.

Mark, B., 2003. Demystifying Mixed Signal Test Methods. Newnes, Oxford, UK., ISBN:0-7506-7616-7, Pages: 267.

Marshall, R.O. and C.M. Akujuobi, 2002. On the use of wavelet transforms in testing for the DNL of ADCs. Proceedings of the 45th Midwest Symposium on Circuits and Systems MWSCAS-2002 Vol. 2, August 4-7, 2002, IEEE, College Station, Texas, ISBN:0-7803-7523-8, pp: 2-25.

Oliver, J., R.S.S. Kumari and V. Sadasivam, 2005. Wavelets for improving spectral efficiency in a digital communication system. Proceedings of the 6th International Conference on Computational Intelligence and Multimedia Applications 2005, August 16-18, 2005, IEEE, Sivakasi, India, ISBN:0-7695-2358-7, pp: 198-203.

Ramos, P.L., J.M. Da Silva, D.R. Ferreira and M.B. Santos, 2016. Statistically enhanced analogue and mixed-signal design and test. Proceedings of the 21st IEEE International Conference on Mixed-Signal Testing Workshop (IMSTW16), July 4-6, 2016, IEEE, Porto, Portugal, ISBN:978-1-5090-2752-1, pp: 1-5.

Rioul, O. and M. Vetterli, 1991. Wavelets and signal processing. IEEE Signal Proc. Mag., 8: 14-38.
CrossRef  |  Direct Link  |  

Serra, A.C., M.F. Da Silva, P.M. Ramos, R.C. Martins and L. Michaeli et al., 2005. Combined spectral and histogram analysis for fast ADC testing. IEEE. Trans. Instrum. Meas., 54: 1617-1623.
CrossRef  |  Direct Link  |  

Silverman, B., 2000. Wavelet: The Key to Intermittent Information. Oxford University Press, New York, USA., Pages: 255.

Wagdy, M.F. and S.S. Awad, 1991. Determining ADC effective number of bits via histogram testing. IEEE. Trans. Instrum. Meas., 40: 770-772.
CrossRef  |  Direct Link  |  

Xu, F., 1999. A new approach for the nonlinearity test of ADCs-DACs and its application for BIST. Proceedings of the 1999 Workshop on European Test, May 25-28, 1999, IEEE, Germany, Europe, ISBN:0-7695-0390-X, pp: 34-38.

Yamaguchi, T. and M. Soma, 1997. Dynamic testing of ADCs using wavelet transforms. Proceedings of the 1997 International Conference on Test, November 6, 1997, IEEE, Japan, ISBN:0-7803-4209-7, pp: 379-388.